Invention Grant
- Patent Title: Work function adjustment on fully silicided (FUSI) gate
- Patent Title (中): 完全硅化(FUSI)门的功能调整
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Application No.: US11458503Application Date: 2006-07-19
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Publication No.: US07501333B2Publication Date: 2009-03-10
- Inventor: Wei-Jung Lin , Cheng-Tung Lin , Chih-Wei Chang , Shau-Lin Shue
- Applicant: Wei-Jung Lin , Cheng-Tung Lin , Chih-Wei Chang , Shau-Lin Shue
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A fully silicided gate with a selectable work function includes; a gate dielectric over the substrate; and a first metal silicide layer over the gate dielectric, and a second metal silicide layer wherein the first metal silicide has a different phase then the second metal silicide layer. The metal silicide layers comprises at least one alloy element. The concentration of the alloy element on the interface between the gate dielectric and the metal silicide layers influence the work function of the gate.
Public/Granted literature
- US20080122018A1 WORK FUNCTION ADJUSTMENT ON FULLY SILICIDED (FUSI) GATE Public/Granted day:2008-05-29
Information query
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