Invention Grant
- Patent Title: Correcting for errors that cause generated digital codes to deviate from expected values in an ADC
- Patent Title (中): 校正导致生成的数字代码偏离ADC中预期值的错误
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Application No.: US11755011Application Date: 2007-05-30
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Publication No.: US07501965B2Publication Date: 2009-03-10
- Inventor: Seetharaman Janakiraman
- Applicant: Seetharaman Janakiraman
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Warren J. Franz; Frederick J. Telecky, Jr.; Wade J. Brady, III
- Main IPC: H03M1/06
- IPC: H03M1/06

Abstract:
Errors in an analog to digital converter that cause generated digital codes to deviate from expected values are corrected. A sample of an analog signal is stored in a storage element. An error signal is then generated, with the error signal representing a deviation of an expected digital code for the strength of a sample of an analog input from a value that would be generated without correction. The error signal is then added to the stored sample. In an embodiment implemented in the context of a SAR ADC, a digital value representing an integral non-linearity error is generated based on a partial digital code (result of a partial conversion of the sample) and an error coefficient. The digital value is converted to analog form by an auxiliary DAC, and added to the stored input sample.
Public/Granted literature
- US20080186214A1 CORRECTING FOR ERRORS THAT CAUSE GENERATED DIGITAL CODES TO DEVIATE FROM EXPECTED VALUES IN AN ADC Public/Granted day:2008-08-07
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