发明授权
- 专利标题: Densitometers and methods for measuring optical density
- 专利标题(中): 光密度计和光密度测量方法
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申请号: US10658939申请日: 2003-09-09
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公开(公告)号: US07502116B2公开(公告)日: 2009-03-10
- 发明人: Omer Gila , William David Holland
- 申请人: Omer Gila , William David Holland
- 申请人地址: US TX Houston
- 专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人地址: US TX Houston
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
Methods for measuring optical density are described. The color on an area is determined. Based on the color, at least a first illumination source is selected. The area is illuminated with the selected illumination source. Radiation is received from the area, and the received radiation is converted to a signal indicative of optical density.
公开/授权文献
- US20050052654A1 Densitometers and methods for measuring optical density 公开/授权日:2005-03-10
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