Invention Grant
- Patent Title: Temperature detection circuit
- Patent Title (中): 温度检测电路
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Application No.: US11709191Application Date: 2007-02-22
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Publication No.: US07502710B2Publication Date: 2009-03-10
- Inventor: Toru Ishikawa
- Applicant: Toru Ishikawa
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2006-048104 20060224
- Main IPC: G01K11/00
- IPC: G01K11/00 ; G01K7/00

Abstract:
First and second reference-potential generator units output first and second reference potentials V1 and V7, respectively, which correspond to first and second specific temperatures to be detected. An intermediate-potentials generator unit divides the potential difference between the reference potential V1 and the reference potential V7 to output intermediate potentials through nodes N2 to N6. A temperature-dependant-potential generator unit outputs the forward voltage drop of a diode which varies depending on the ambient temperature. A comparator compares one of the potentials of nodes N1 to N7 selected by a selector against the potential output by the temperature-dependant-potential generator unit and outputs the result of the comparison indicating the range of the ambient temperature.
Public/Granted literature
- US20070203664A1 Temperature detection circuit Public/Granted day:2007-08-30
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