Invention Grant
- Patent Title: MOS transistors with selectively strained channels
- Patent Title (中): 具有选择性应变通道的MOS晶体管
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Application No.: US11717450Application Date: 2007-03-13
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Publication No.: US07511348B2Publication Date: 2009-03-31
- Inventor: Chih-Hsin Ko , Wen-Chin Lee , Chung-Hu Ke , Hung-Wei Chen
- Applicant: Chih-Hsin Ko , Wen-Chin Lee , Chung-Hu Ke , Hung-Wei Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
The channels of first and second CMOS transistors can be selectively stressed. A gate structure of the first transistor includes a stressor that produces stress in the channel of the first transistor. A gate structure of the second transistor is disposed in contact with a layer of material that produces stress in the channel of the second transistor.
Public/Granted literature
- US20080224225A1 MOS transistors with selectively strained channels Public/Granted day:2008-09-18
Information query
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