发明授权
- 专利标题: Imprint lithography
- 专利标题(中): 印刷光刻
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申请号: US11312659申请日: 2005-12-21
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公开(公告)号: US07517211B2公开(公告)日: 2009-04-14
- 发明人: Yvonne Wendela Kruijt-Stegeman , Raymond Jacobus Knaapen , Johan Frederik Dijksman , Krassimir Todorov Krastev , Sander Frederik Wuister , Aleksey Yurievich Kolesnychenko , Karel Diederick Van Der Mast , Klaus Simon
- 申请人: Yvonne Wendela Kruijt-Stegeman , Raymond Jacobus Knaapen , Johan Frederik Dijksman , Krassimir Todorov Krastev , Sander Frederik Wuister , Aleksey Yurievich Kolesnychenko , Karel Diederick Van Der Mast , Klaus Simon
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 主分类号: B29C59/00
- IPC分类号: B29C59/00
摘要:
An imprint lithography apparatus is disclosed that has a first array of template holders, a second array of template holders, and a substrate table arranged to support a substrate to be imprinted, wherein the first array of template holders is arranged to hold an array of imprint templates that can be used to imprint a first array of patterns onto the substrate, and the second array of template holders is arranged hold an array of imprint templates that can be used to imprint a second array of patterns onto the substrate, the patterns imprinted by the second array being interspersed between the patterns imprinted by the first array.
公开/授权文献
- US20070141191A1 Imprint lithography 公开/授权日:2007-06-21
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