发明授权
- 专利标题： Sub-wavelength imaging and irradiation with entangled particles
- 专利标题（中）： 亚波长成像和缠结颗粒的照射
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申请号： US11615547申请日： 2006-12-22
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公开(公告)号： US07518127B2公开(公告)日： 2009-04-14
- 发明人: Joachim von Zanthier , Christoph Thiel , Enrique Solano , Thierry Bastin , Girish S. Agarwal
- 申请人： Joachim von Zanthier , Christoph Thiel , Enrique Solano , Thierry Bastin , Girish S. Agarwal
- 代理机构： Patterson & Sheridan, LLP
- 主分类号： G21K5/02
- IPC分类号： G21K5/02
摘要：
A method and apparatus for using one particle out of N particles for irradiating or investigating a target are provided. A radiation source with N incoherent emitters emits a radiation, and particles of said radiation are detected by using at least N−1 detectors located at N−1 different positions. A discriminator is adapted for identifying particle detection events on at least N−1 detectors within a predetermined time period from other particle detection events.
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