发明授权
- 专利标题: Optical waveform measurement apparatus and optical waveform measurement method
- 专利标题(中): 光波形测量装置和光波形测量方法
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申请号: US11477538申请日: 2006-06-30
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公开(公告)号: US07518711B2公开(公告)日: 2009-04-14
- 发明人: Fumio Futami , Shigeki Watanabe , Shunsuke Ono , Ryou Okabe
- 申请人: Fumio Futami , Shigeki Watanabe , Shunsuke Ono , Ryou Okabe
- 申请人地址: JP Kawasaki
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: JP Kawasaki
- 代理机构: Staas & Halsey LLP
- 优先权: JP2006-064798 20060309
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
A first polarization controller controls a polarization state of measured light. A second polarization controller controls a polarization state of an optical sampling pulse. The measured light and the optical sampling pulse having the polarization states controlled are input to an optical fiber. An optical signal output from the optical fiber is transmitted to a polarizer. A first control unit adjusts the first polarization controller based on the measured light output from the optical fiber and the measured light output from the polarizer. A second control unit adjusts the second polarization controller based on an optical sampling pulse output from the optical fiber. Waveform measurement is performed by using the output of the polarizer.
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