发明授权
- 专利标题: Automatic testing apparatus and method
- 专利标题(中): 自动测试仪器及方法
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申请号: US11451184申请日: 2006-06-12
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公开(公告)号: US07525303B2公开(公告)日: 2009-04-28
- 发明人: Chuan-Bang Wang , Yu-Ping Wu , Yan-Kai Zhang , Jun She
- 申请人: Chuan-Bang Wang , Yu-Ping Wu , Yan-Kai Zhang , Jun She
- 申请人地址: CN Shenzhen, Guangdong Province TW Miao-Li County
- 专利权人: Innocom Technology (Shenzhen) Co., Ltd.,Innolux Display Corp.
- 当前专利权人: Innocom Technology (Shenzhen) Co., Ltd.,Innolux Display Corp.
- 当前专利权人地址: CN Shenzhen, Guangdong Province TW Miao-Li County
- 代理商 Wei Te Chung
- 优先权: TW94119220A 20050610
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
An automatic testing apparatus (200) includes a transmission floor (210), a board (220), a stopping unit (230), and a testing device (260) beside the transmission floor. The transmission floor includes a plurality of rollers (211) positioned at two sides thereof. The board positioned on the rollers includes an I/O (input/output) circuit (222) and a first connector (265) electrically connected to the I/O circuit. The testing device includes a second connector (225) matchable with the first connector. The I/O circuit is used to electrically connect to an electronic device to be tested, such as an LCD (280). The stopping unit is positioned at the transmission floor for stopping the board moving. An automatic testing method using the automatic testing apparatus for testing an electronic device is also provided. The efficiency of the automatic testing apparatus is high.
公开/授权文献
- US20060279307A1 Automatic testing apparatus and method 公开/授权日:2006-12-14
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