发明授权
- 专利标题: Method of analyzing mass analysis data and apparatus for the method
- 专利标题(中): 分析方法的质量分析数据和设备
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申请号: US11730983申请日: 2007-04-05
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公开(公告)号: US07529630B2公开(公告)日: 2009-05-05
- 发明人: Shinichi Yamaguchi , Yusuke Inohana
- 申请人: Shinichi Yamaguchi , Yusuke Inohana
- 申请人地址: JP Kyoto
- 专利权人: Shimadzu Corporation
- 当前专利权人: Shimadzu Corporation
- 当前专利权人地址: JP Kyoto
- 代理机构: Westerman, Hattori, Daniels & Adrian, LLP.
- 优先权: JP2006-109962 20060412
- 主分类号: C12Q1/04
- IPC分类号: C12Q1/04
摘要:
The present invention provides a method and an apparatus for analyzing mass analysis data for selecting a component similar to a target component quickly and accurately, based on MSn analysis for each unknown component in the sample. First, MSn analysis is performed for each of the components in the mixed sample, and based on the obtained spectral data (measured data) and the spectral data of the target component (reference data), predetermined parameters are extracted (Step S11 to S13). Next, by multivariable analysis of the parameters, the similarity between the target component and each of the components in the mixed sample is evaluated (Step S14). Finally, based on the similarity value, components similar to the target component are selected (Step S16).
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