Invention Grant
- Patent Title: Testing system for digital camera modules
- Patent Title (中): 数码相机模块测试系统
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Application No.: US11592768Application Date: 2006-11-03
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Publication No.: US07538862B2Publication Date: 2009-05-26
- Inventor: Steven Webster , Ying-Cheng Wu , Yuan-Po Wang
- Applicant: Steven Webster , Ying-Cheng Wu , Yuan-Po Wang
- Applicant Address: TW Chu-Nan, Miao-Li Hsien
- Assignee: Altus Technology Inc.
- Current Assignee: Altus Technology Inc.
- Current Assignee Address: TW Chu-Nan, Miao-Li Hsien
- Agent Steven M. Reiss
- Priority: CN200510121183 20051223
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A testing system (200) for digital camera modules (100) includes a first testing module (50), an assembling mechanism (60), a focusing module (62), a second testing module (70), a carrying mechanism (80), and a main processor (90). The carrying mechanism supports and transports subassemblies of the digital camera modules and the digital camera modules between the first testing module, the assembling mechanism, the focusing module and the second testing module. The first testing module, the assembling mechanism, the focusing module, the carrying mechanism, and the second testing module are all electronically connected with the main processor.
Public/Granted literature
- US20070146486A1 Testing system for digital camera modules Public/Granted day:2007-06-28
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