Invention Grant
- Patent Title: X-ray diffraction equipment for X-ray scattering
- Patent Title (中): 用于X射线散射的X射线衍射设备
-
Application No.: US12014437Application Date: 2008-01-15
-
Publication No.: US07542547B2Publication Date: 2009-06-02
- Inventor: Vladimir Kogan
- Applicant: Vladimir Kogan
- Applicant Address: NL Almelo
- Assignee: PANalytical B.V.
- Current Assignee: PANalytical B.V.
- Current Assignee Address: NL Almelo
- Agency: Bromberg & Sunstein LLP
- Priority: EP07100858 20070119
- Main IPC: G01N23/20
- IPC: G01N23/20
Abstract:
An X-ray scattering chamber 12 includes a housing 14 that may be mounted in X-ray diffraction equipment between an X-ray source 2 and an X-ray detector 4, for example on goniometer arm 6. The housing 14 includes sample holder 16 and beam conditioning optics 22,24, but the system also makes use of primary optics 10 outside the housing. The equipment is suitable for SAXS and/or SAXS-WAXS.
Public/Granted literature
- US20080175352A1 X-Ray Diffraction Equipment for X-Ray Scattering Public/Granted day:2008-07-24
Information query
