Invention Grant
- Patent Title: Chemical mechanical polishing composition
- Patent Title (中): 化学机械抛光组合物
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Application No.: US11454981Application Date: 2006-06-19
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Publication No.: US07550092B2Publication Date: 2009-06-23
- Inventor: Hui-Fang Hou , Wen-Cheng Liu , Pao-Cheng Chen , Yen-Liang Chen , Jui-Ching Chen
- Applicant: Hui-Fang Hou , Wen-Cheng Liu , Pao-Cheng Chen , Yen-Liang Chen , Jui-Ching Chen
- Applicant Address: TW Kaohsiung County
- Assignee: Epoch Material Co., Ltd.
- Current Assignee: Epoch Material Co., Ltd.
- Current Assignee Address: TW Kaohsiung County
- Agency: Davidson Berquist Jackson & Gowdey LLP
- Main IPC: C09K13/00
- IPC: C09K13/00

Abstract:
A chemical mechanical polishing composition includes: an abrasive component, a corrosion inhibitor, a surfactant, a diacid compound, a metal residue inhibitor, and water. The metal residue inhibitor is selected from the group of compounds having the following formulas: and combinations thereof, wherein R1, R2, R3, and R4 are independently selected from H, C1-C6 alkyl, C2-C6 alkenyl, and C2-C6 alkylidyne; and R5, R6, R7, R8, R9, and R10 are independently selected from H and C1-C6 alkyl.
Public/Granted literature
- US20070290165A1 Chemical mechanical polishing composition Public/Granted day:2007-12-20
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