发明授权
- 专利标题: Semiconductor memory device having a voltage boosting circuit
- 专利标题(中): 具有升压电路的半导体存储器件
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申请号: US11473402申请日: 2006-06-24
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公开(公告)号: US07558128B2公开(公告)日: 2009-07-07
- 发明人: Chang-Ho Shin , Jong-Hyun Choi
- 申请人: Chang-Ho Shin , Jong-Hyun Choi
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics. Co., Ltd.
- 当前专利权人: Samsung Electronics. Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2005-0055278 20050624
- 主分类号: G11C5/14
- IPC分类号: G11C5/14
摘要:
A semiconductor memory device includes a cell array internal voltage generating circuit for generating cell array reference voltage and a cell array internal voltage from a first external power voltage, a peripheral circuit internal voltage generating circuit for generating a peripheral circuit reference voltage and a peripheral circuit internal voltage from the first external power voltage, and a voltage boosting circuit power voltage generating circuit for generating a voltage boosting circuit reference voltage and a voltage boosting circuit power voltage from a second external power voltage.
公开/授权文献
- US20060291279A1 Semiconductor memory device 公开/授权日:2006-12-28
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