Invention Grant
- Patent Title: Personnel x-ray inspection system
- Patent Title (中): 人员x射线检查系统
-
Application No.: US11838783Application Date: 2007-08-14
-
Publication No.: US07561666B2Publication Date: 2009-07-14
- Inventor: Martin Annis
- Applicant: Martin Annis
- Agency: Altman & Martin
- Agent Steven K Martin
- Main IPC: G01N23/203
- IPC: G01N23/203

Abstract:
A dual-energy x-ray source located a distance of one half of the maximum width of the subject from the subject emits a cone beam to a horizontal slit in an x-ray-blocking sheet, producing a fan beam that is chopped into a pencil beam by a rotating disk with radial slots. The pencil beam sweeps a subject, producing backscatter read by a plastic scintillator detector situated very close to and curved around the sides of the subject. The entire assembly translates vertically to produce a complete image of the subject. Pencil beam area is increased farther from the center by increasing the width of the slit toward both ends and increasing the width of the slots toward the outer end. High and low peak x-ray energies of 50 KeV or more and 30 KeV or less, respectively, enable differentiation between innocent and contraband materials that both contain low Z materials.
Public/Granted literature
- US20080043913A1 Personnel X-ray Inspection System Public/Granted day:2008-02-21
Information query