Invention Grant
- Patent Title: Sensitive emission light gathering and flow through detection system
- Patent Title (中): 敏感发射光采集和流过检测系统
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Application No.: US11705606Application Date: 2007-02-13
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Publication No.: US07565042B2Publication Date: 2009-07-21
- Inventor: Cha-Mei Tang , Platte T Amstulz, III
- Applicant: Cha-Mei Tang , Platte T Amstulz, III
- Applicant Address: US MD Potomac
- Assignee: Creatv MicroTech, Inc.
- Current Assignee: Creatv MicroTech, Inc.
- Current Assignee Address: US MD Potomac
- Agency: Roylance, Abrams, Berdo & Goodman, L.L.P.
- Main IPC: G02B6/32
- IPC: G02B6/32 ; G02B6/42 ; G02B6/00

Abstract:
A luminometer is provided comprising a flow through waveguide and one or more detectors. The flow through waveguide has at least two openings and the sample is free to enter from one opening and exit from the other. The flow through waveguide can be made of material that guides emission light to a bottom end of the flow through waveguide. One or more detectors may be provided which detect the emission light coming out of the bottom of the flow through waveguide. A fluorometer/photometer is also provided that comprises a flow through waveguide, one or more excitation light sources, and one or more optical detectors. The flow through waveguide has a hollow region to hold the sample. The excitation light is introduced at an angle or perpendicular to one surface of the flow through waveguide. The flow through waveguide is made of material that can guide absorption and/or emission light to the bottom end of the flow through waveguide. There are one or more detectors that detect the emission light coming out of the bottom of the flow through waveguide.
Public/Granted literature
- US20080019658A1 Sensitive emission light gathering and flow through detection system Public/Granted day:2008-01-24
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