发明授权
US07566891B2 Apparatus and method for treating a substrate with UV radiation using primary and secondary reflectors
有权
使用初级和次级反射器用UV辐射处理衬底的装置和方法
- 专利标题: Apparatus and method for treating a substrate with UV radiation using primary and secondary reflectors
- 专利标题(中): 使用初级和次级反射器用UV辐射处理衬底的装置和方法
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申请号: US11686878申请日: 2007-03-15
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公开(公告)号: US07566891B2公开(公告)日: 2009-07-28
- 发明人: Juan Carlos Rocha-Alvarez , Thomas Nowak , Dale R. Du Bois , Sanjeev Baluja , Scott A. Hendrickson , Dustin W. Ho , Andrzei Kaszuba , Tom K. Cho
- 申请人: Juan Carlos Rocha-Alvarez , Thomas Nowak , Dale R. Du Bois , Sanjeev Baluja , Scott A. Hendrickson , Dustin W. Ho , Andrzei Kaszuba , Tom K. Cho
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Townsend and Townsend and Crew
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N21/33 ; B01J19/08 ; B29C35/08
摘要:
Embodiments of the invention relate generally to an ultraviolet (UV) cure chamber for curing a dielectric material disposed on a substrate and to methods of curing dielectric materials using UV radiation. A substrate processing tool according to one embodiment comprises a body defining a substrate processing region; a substrate support adapted to support a substrate within the substrate processing region; an ultraviolet radiation lamp spaced apart from the substrate support, the lamp configured to transmit ultraviolet radiation to a substrate positioned on the substrate support; and a motor operatively coupled to rotate at least one of the ultraviolet radiation lamp or substrate support at least 180 degrees relative to each other. The substrate processing tool may further comprise one or more reflectors adapted to generate a flood pattern of ultraviolet radiation over the substrate that has complementary high and low intensity areas which combine to generate a substantially uniform irradiance pattern if rotated. Other embodiments are also disclosed.
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