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US07569482B2 Method for the selective removal of an unsilicided metal 有权
选择性除去未硅化金属的方法

Method for the selective removal of an unsilicided metal
Abstract:
An integrated circuit is silicided by depositing at least one metal on a silicon-containing region and forming a metal silicide. Residue metal that has not been silicided during the formation of the metal silicide is then removed. The removal of the residue metal involves the conversion of the residue metal to an alloy containing the germanide of said metal with minimal if any adverse affect on the silicide. Next, the alloy is removed, in a manner selective to the silicide, by dissolving the alloy in a chemical solution.
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