Invention Grant
- Patent Title: Method for the selective removal of an unsilicided metal
- Patent Title (中): 选择性除去未硅化金属的方法
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Application No.: US11654388Application Date: 2007-01-15
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Publication No.: US07569482B2Publication Date: 2009-08-04
- Inventor: Aomar Halimaoui
- Applicant: Aomar Halimaoui
- Applicant Address: FR Crolles Cedex
- Assignee: STMicroelectronics (Crolles 2) SAS
- Current Assignee: STMicroelectronics (Crolles 2) SAS
- Current Assignee Address: FR Crolles Cedex
- Agency: Gardere Wynne Sewell LLP
- Priority: FR0600436 20060118
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/461 ; H01L21/4763 ; H01L21/44

Abstract:
An integrated circuit is silicided by depositing at least one metal on a silicon-containing region and forming a metal silicide. Residue metal that has not been silicided during the formation of the metal silicide is then removed. The removal of the residue metal involves the conversion of the residue metal to an alloy containing the germanide of said metal with minimal if any adverse affect on the silicide. Next, the alloy is removed, in a manner selective to the silicide, by dissolving the alloy in a chemical solution.
Public/Granted literature
- US20070197029A1 Method for the selective removal of an unsilicided metal Public/Granted day:2007-08-23
Information query
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