Invention Grant
US07573058B2 Phase change materials, phase change random access memories having the same and methods of operating phase change random access memories
有权
相变材料,具有相同的相变随机存取存储器和操作相变随机存取存储器的方法
- Patent Title: Phase change materials, phase change random access memories having the same and methods of operating phase change random access memories
- Patent Title (中): 相变材料,具有相同的相变随机存取存储器和操作相变随机存取存储器的方法
-
Application No.: US11509001Application Date: 2006-08-24
-
Publication No.: US07573058B2Publication Date: 2009-08-11
- Inventor: Jin-seo Noh , Ki-joon Kim , Yoon-ho Khang
- Applicant: Jin-seo Noh , Ki-joon Kim , Yoon-ho Khang
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce
- Priority: KR10-2006-0001392 20060105
- Main IPC: H01L29/02
- IPC: H01L29/02

Abstract:
A phase change memory device includes a switch and a storage node connected to the switch. The storage node includes a first electrode, a phase change layer and a second electrode. The phase change layer is formed of an InSbTe compound doped with Ge. In a method of operating a phase change memory including a switch and a storage node, the switch is maintained in an on state, and a first current is applied to the storage node.
Public/Granted literature
Information query
IPC分类: