Invention Grant
US07576555B2 Current measuring apparatus, test apparatus, current measuring method and test method
失效
电流测量装置,试验装置,电流测量方法和试验方法
- Patent Title: Current measuring apparatus, test apparatus, current measuring method and test method
- Patent Title (中): 电流测量装置,试验装置,电流测量方法和试验方法
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Application No.: US11755746Application Date: 2008-07-30
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Publication No.: US07576555B2Publication Date: 2009-08-18
- Inventor: Yoshihiro Hashimoto
- Applicant: Yoshihiro Hashimoto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Priority: JP2005-050071 20050225
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
There is provided a current measuring apparatus that measures an electric current received by an electronic device from an input terminal, The current measuring apparatus includes a first voltage accumulator that accumulates a reference supply voltage that acts as a reference for a voltage being supplied to the electronic device during measuring electric currents, a first switch that connects a power supply to the first voltage accumulator to accumulate the reference supply voltage before measuring electric currents and disconnects the power supply from the first voltage accumulator during measuring electric currents, a current supplying section that supplies an electric current based on the reference supply voltage accumulated in the first voltage accumulator and a terminal voltage of the input terminal to the electronic device during measuring electric currents, and a first current measuring section that measures the supply current supplied to the electronic device.
Public/Granted literature
- US20090021239A1 CURRENT MEASURING APPARATUS, TEST APPARTAUS, CURRENT MEASURING METHOD AND TEST METHOD Public/Granted day:2009-01-22
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