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发明授权
US07576569B2 Circuit for dynamic circuit timing synthesis and monitoring of critical paths and environmental conditions of an integrated circuit 失效
用于动态电路定时合成和监控集成电路的关键路径和环境条件的电路

Circuit for dynamic circuit timing synthesis and monitoring of critical paths and environmental conditions of an integrated circuit
摘要：
A circuit for dynamically monitoring the operation of an integrated circuit under differing temperature, frequency, and voltage (including localized noise and droop), and for detecting early life wear-out mechanisms (e.g., NBTI, hot electrons).
摘要（中）：

用于在不同的温度，频率和电压（包括局部噪声和下垂）下动态地监测集成电路的操作以及用于检测早期寿命磨损机制（例如，NBTI，热电子）的电路。

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