发明授权
US07576850B2 In-process vision detection of flaws and FOD by back field illumination
有权
通过后场照明进行瑕疵和FOD的过程中视觉检测
- 专利标题： In-process vision detection of flaws and FOD by back field illumination
- 专利标题（中）： 通过后场照明进行瑕疵和FOD的过程中视觉检测
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申请号： US12179674申请日： 2008-07-25
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公开(公告)号： US07576850B2公开(公告)日： 2009-08-18
- 发明人: Roger W. Engelbart , Reed Hannebaum , Tim Pollock
- 申请人： Roger W. Engelbart , Reed Hannebaum , Tim Pollock
- 申请人地址： US IL Chicago
- 专利权人： The Boeing Company
- 当前专利权人： The Boeing Company
- 当前专利权人地址： US IL Chicago
- 代理机构： Ostrager Chong Flaherty & Broitman P.C.
- 主分类号： G01N21/00
- IPC分类号： G01N21/00
摘要：
A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
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