发明授权
US07580314B2 Memory device having open bit line structure and method of sensing data therefrom 失效
具有开放位线结构的存储器件和从其感测数据的方法

Memory device having open bit line structure and method of sensing data therefrom
摘要:
A memory device includes a plurality of memory blocks. Each memory block includes a plurality of bit lines, a plurality of word lines, a plurality of memory cells provided at intersections of the bit lines and word lines; a plurality of capacitors, and a plurality of sense amplifiers. Each sense amplifier has a first input and a second input. The first input is connected to a first bit line of a first one of the memory blocks and is coupled via one of the capacitors to a first bit line of a second one of the memory blocks. The second input of the input is connected to a second bit line of the second one of the memory blocks and is coupled via one of the capacitors to a second bit line of the first one of the memory blocks.
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