发明授权
US07580314B2 Memory device having open bit line structure and method of sensing data therefrom
失效
具有开放位线结构的存储器件和从其感测数据的方法
- 专利标题: Memory device having open bit line structure and method of sensing data therefrom
- 专利标题(中): 具有开放位线结构的存储器件和从其感测数据的方法
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申请号: US11649273申请日: 2007-01-04
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公开(公告)号: US07580314B2公开(公告)日: 2009-08-25
- 发明人: Su-A Kim , Ki-Whan Song
- 申请人: Su-A Kim , Ki-Whan Song
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Volentine & Whitt, PLLC
- 优先权: KR2006-0047576 20060526
- 主分类号: G11C8/00
- IPC分类号: G11C8/00
摘要:
A memory device includes a plurality of memory blocks. Each memory block includes a plurality of bit lines, a plurality of word lines, a plurality of memory cells provided at intersections of the bit lines and word lines; a plurality of capacitors, and a plurality of sense amplifiers. Each sense amplifier has a first input and a second input. The first input is connected to a first bit line of a first one of the memory blocks and is coupled via one of the capacitors to a first bit line of a second one of the memory blocks. The second input of the input is connected to a second bit line of the second one of the memory blocks and is coupled via one of the capacitors to a second bit line of the first one of the memory blocks.
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