Invention Grant
US07583578B2 Optical storage medium inspection method for determining if an optical storage medium is good or defective
有权
用于确定光学存储介质是好还是有缺陷的光存储介质检查方法
- Patent Title: Optical storage medium inspection method for determining if an optical storage medium is good or defective
- Patent Title (中): 用于确定光学存储介质是好还是有缺陷的光存储介质检查方法
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Application No.: US11980662Application Date: 2007-10-31
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Publication No.: US07583578B2Publication Date: 2009-09-01
- Inventor: Shin-ichi Kadowaki , Mamoru Shoji , Atsushi Nakamura , Takashi Ishida
- Applicant: Shin-ichi Kadowaki , Mamoru Shoji , Atsushi Nakamura , Takashi Ishida
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPP2002-100961 20020403; JPP2002-152904 20020527; JPP2002-217856 20020726
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
An optical disc drive having an optical pickup head emitting a light beam to an optical storage medium, detecting the light beam reflected from the optical storage medium, and outputting a signal based on the received reflected light, having a jitter measuring unit measuring jitter in signals output from the optical pickup head and having an evaluation unit determining from the measured jitter if the optical storage medium is good or defective. The jitter measuring unit measures jitter in a train of 3T or longer marks or spaces from an optical storage medium to which digital information is recorded as a train of marks or spaces of length kT based on a period T and an integer k of two or more.
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