发明授权
US07586603B2 Method and apparatus for improved signal to noise ratio in Raman signal detection for MEMS based spectrometers
失效
用于基于MEMS的光谱仪的拉曼信号检测中改善信噪比的方法和装置
- 专利标题： Method and apparatus for improved signal to noise ratio in Raman signal detection for MEMS based spectrometers
- 专利标题（中）： 用于基于MEMS的光谱仪的拉曼信号检测中改善信噪比的方法和装置
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申请号： US12104471申请日： 2008-04-17
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公开(公告)号： US07586603B2公开(公告)日： 2009-09-08
- 发明人: Sandip Maity , Ayan Banerjee , Anis Zribi , Stacey Kennerly , Long Que , Glenn Claydon , Shankar Chandrasekaran , Shivappa Goravar
- 申请人： Sandip Maity , Ayan Banerjee , Anis Zribi , Stacey Kennerly , Long Que , Glenn Claydon , Shankar Chandrasekaran , Shivappa Goravar
- 申请人地址： US NY Niskayuna
- 专利权人： General Electric Company
- 当前专利权人： General Electric Company
- 当前专利权人地址： US NY Niskayuna
- 代理商 Joseph J. Christian
- 主分类号： G01J3/44
- IPC分类号： G01J3/44
摘要：
A method of Raman detection for a portable, integrated spectrometer instrument includes directing Raman scattered photons by a sample to an avalanche photodiode (APD), the APD configured to generate an output signal responsive to the intensity of the Raman scattered photons incident thereon. The output signal of the APD is amplified and passed through a discriminator so as to reject at least one or more of amplifier noise and dark noise. A number of discrete output pulses within a set operational range of the discriminator is counted so as to determine a number of photons detected by the APD.
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