Invention Grant
- Patent Title: Nondestructive reliability monitoring method for adhesively bonded structures whose sensitivity is improved by using piezoelectric or conductive materials
- Patent Title (中): 通过使用压电或导电材料提高灵敏度的粘结结构的非破坏性可靠性监测方法
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Application No.: US11752159Application Date: 2007-05-22
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Publication No.: US07589457B2Publication Date: 2009-09-15
- Inventor: Dai-Gil Lee , Hui-Yun Hwang , Woo-Seok Chin , Seung-Min Lee , Byung-Chul Kim , Jae-Wook Kwon , Soon-Ho Yoon
- Applicant: Dai-Gil Lee , Hui-Yun Hwang , Woo-Seok Chin , Seung-Min Lee , Byung-Chul Kim , Jae-Wook Kwon , Soon-Ho Yoon
- Applicant Address: KR
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: KR10-2004-0096491 20041123
- Main IPC: H01L41/113
- IPC: H01L41/113

Abstract:
A method is disclosed for testing bonded part integrity of bonded structures with increased sensitivity and in a nondestructive manner. The method includes the steps of: mixing a piezoelectric material or an electrically conductive material with an adhesive agent, curing the adhesive agent in between bonding target objects, electrically connecting the bonding target objects to one another, causing an electric current to flow through the bonding target objects to measure a quantity of electric charges flowing between the bonding target objects, and determining existence of bonding damage between the bonding target objects and the adhesive agent based on the quantity of electric charges and predicting a remaining life span of the bonded structures based on a data indicating a correlation between the quantity of electric charges and a predetermined fatigue life.
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