发明授权
- 专利标题: Halftone type phase shift mask blank and phase shift mask thereof
- 专利标题(中): 半色调型相移掩模空白及其相移掩模
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申请号: US11562217申请日: 2006-11-21
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公开(公告)号: US07592106B2公开(公告)日: 2009-09-22
- 发明人: Yuuki Shiota , Osamu Nozawa , Hideaki Mitsui
- 申请人: Yuuki Shiota , Osamu Nozawa , Hideaki Mitsui
- 申请人地址: JP Tokyo
- 专利权人: Hoya Corporation
- 当前专利权人: Hoya Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JPP.2002-047050 20020222; JPP.2002-124769 20020425; JPP.2002-325200 20021108
- 主分类号: G03F1/00
- IPC分类号: G03F1/00 ; G03C5/00
摘要:
A halftone type phase shift mask blank including, on a transparent substrate, at least a phase shifter film having a predetermined transmittance for an exposed light and a predetermined phase difference for the transparent substrate, wherein the phase shifter film is formed by a multilayer film in which films including at least two layers having an upper layer formed on the most surface side and a lower layer formed thereunder are provided, and a thickness of the upper layer is adjusted in such a manner that a refractive index of the film to be the upper layer is smaller than that of the film to be the lower layer and a surface reflectance for the inspecting light of the phase shifter film is maximized and approximates to a maximum.
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