发明授权
- 专利标题: Method of mass spectrometry and mass spectrometer
- 专利标题(中): 质谱法和质谱仪
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申请号: US11716615申请日: 2007-03-12
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公开(公告)号: US07592589B2公开(公告)日: 2009-09-22
- 发明人: Yuichiro Hashimoto , Hideki Hasegawa , Takashi Baba , Izumi Waki
- 申请人: Yuichiro Hashimoto , Hideki Hasegawa , Takashi Baba , Izumi Waki
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 主分类号: H01J49/42
- IPC分类号: H01J49/42
摘要:
A mass spectrometry device includes an ion source for ionizing a sample, an ion trap for trapping ions ionized by the ion source. A control unit for controlling voltages applied to lenses forming part of the ion trap, and a detection unit for detecting the ions trapped by said ion trap. The control unit causes a trap potential to be generated on a central axis of quadrupole rods forming part of the ion trap, causes part of the trapped ions to be oscillated in an intermediate direction between the quadrupole rods which are mutually adjacent to each other, and applies a voltage for ejecting the oscillated ions in a central-axis direction of the quadrupole rods by generating an extraction field.
公开/授权文献
- US20070181804A1 Method of mass spectrometry and mass spectrometer 公开/授权日:2007-08-09
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