发明授权
US07598513B2 SixSnyGe1-x-y and related alloy heterostructures based on Si, Ge and Sn
失效
SixSnyGe1-x-y和基于Si,Ge和Sn的相关合金异质结构
- 专利标题: SixSnyGe1-x-y and related alloy heterostructures based on Si, Ge and Sn
- 专利标题(中): SixSnyGe1-x-y和基于Si,Ge和Sn的相关合金异质结构
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申请号: US10559979申请日: 2004-06-14
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公开(公告)号: US07598513B2公开(公告)日: 2009-10-06
- 发明人: John Kouvetakis , Matthew Bauer , John Tolle
- 申请人: John Kouvetakis , Matthew Bauer , John Tolle
- 专利权人: Arizona Board of Regents, Acting for and on behalf of Arizona State University, A Corporate Body Organized under Arizona Law
- 当前专利权人: Arizona Board of Regents, Acting for and on behalf of Arizona State University, A Corporate Body Organized under Arizona Law
- 代理机构: McDonnell Boehnen Hulbert & Berghoff LLP
- 国际申请: PCT/US2004/018969 WO 20040614
- 国际公布: WO2005/015609 WO 20050217
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L21/336
摘要:
A novel method for synthesizing device-quality alloys and ordered phases in a Si—Ge—Sn system uses a UHV-CVD process and reactions of SnD4 with SiH3GeH3. Using the method, single-phase SixSnyGe1-x-y semiconductors (x≦0.25, y≦0.11) are grown on Si via Ge1-xSnx buffer layers The Ge1-xSnx buffer layers facilitate heteroepitaxial growth of the SixSnyGe1-x-y films and act as compliant templates that can conform structurally and absorb the differential strain imposed by the more rigid Si and Si—Ge—Sn materials. The SiH3GeH3 species was prepared using a new and high yield method that provided high purity semiconductor grade material.
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