发明授权
US07602495B2 Method for measuring dissociation constant by surface plasmon resonance analysis 有权
通过表面等离子体共振分析测量解离常数的方法

  • 专利标题: Method for measuring dissociation constant by surface plasmon resonance analysis
  • 专利标题(中): 通过表面等离子体共振分析测量解离常数的方法
  • 申请号: US11660958
    申请日: 2005-08-24
  • 公开(公告)号: US07602495B2
    公开(公告)日: 2009-10-13
  • 发明人: Koji KurumaHirohiko Tsuzuki
  • 申请人: Koji KurumaHirohiko Tsuzuki
  • 申请人地址: JP Tokyo
  • 专利权人: FUJIFILM Corporation
  • 当前专利权人: FUJIFILM Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Sughrue Mion, PLLC
  • 优先权: JP2004-244151 20040824
  • 国际申请: PCT/JP2005/015318 WO 20050824
  • 国际公布: WO2006/022277 WO 20060302
  • 主分类号: G01N21/55
  • IPC分类号: G01N21/55
Method for measuring dissociation constant by surface plasmon resonance analysis
摘要:
An object to be solved by the present invention is to determine the dissociation constant of an analyte molecule immobilized on a metal surface and a molecule that interacts therewith in surface plasmon resonance (SPR) analysis via an analytical method that produces a low noise level (i.e., a noise width of a reference chip), small baseline fluctuations (i.e., signal changes of a reference chip), and highly reliable results of measurement. The present invention provides a method for determining a dissociation constant of an analyte molecule immobilized on a metal surface and a molecule that interacts therewith, wherein changes in surface plasmon resonance signals are measured by using a surface plasmon resonance measurement device comprising a flow channel system having a cell formed on a metal film and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the metal film; wherein a change in surface plasmon resonance signals is measured in a state where the flow of the liquid has been stopped, after the liquid contained in the above flow channel system has been exchanged; and wherein the dissociation constant is determined based on the results of measurement of signal changes.
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