发明授权
- 专利标题: Localized biasing for silicon on insulator structures
- 专利标题(中): 硅绝缘体结构的局部偏置
-
申请号: US10230938申请日: 2002-08-29
-
公开(公告)号: US07608927B2公开(公告)日: 2009-10-27
- 发明人: Fernando Gonzalez , John K. Zahurak
- 申请人: Fernando Gonzalez , John K. Zahurak
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Schwegman, Lundberg & Woessner, P.A.
- 主分类号: H01L23/48
- IPC分类号: H01L23/48
摘要:
A silicon-on-insulator device has a localized biasing structure formed in the insulator layer of the SOI. The localized biasing structure includes a patterned conductor that provides a biasing signal to distinct regions of the silicon layer of the SOI. The conductor is recessed into the insulator layer to provide a substantially planar interface with the silicon layer. The conductor is connected to a bias voltage source. In an embodiment, a plurality of conductor is provided that respectively connected to a plurality of voltage sources. Thus, different regions of the silicon layer are biased by different bias signals.
公开/授权文献
- US20040041265A1 Localized biasing for silicon on insulator structures 公开/授权日:2004-03-04
信息查询
IPC分类: