Invention Grant
US07610540B2 Method for generating, from a test cube set, a generator configured to generate a test pattern
失效
从测试立方体集合生成被配置为生成测试图案的生成器的方法
- Patent Title: Method for generating, from a test cube set, a generator configured to generate a test pattern
- Patent Title (中): 从测试立方体集合生成被配置为生成测试图案的生成器的方法
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Application No.: US12265300Application Date: 2008-11-05
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Publication No.: US07610540B2Publication Date: 2009-10-27
- Inventor: Kedarnath Balakrishnan , Seongmoon Wang , Wenlong Wei , Srimat T. Chakradhar
- Applicant: Kedarnath Balakrishnan , Seongmoon Wang , Wenlong Wei , Srimat T. Chakradhar
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph J. Kolodka
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06G7/58
Abstract:
Disclosed is a logic testing system that includes a decompressor and a tester in communication with the decompressor. The tester is configured to store a seed and locations of scan inputs and is further configured to transmit the seed and the locations of scan inputs to the decompressor. The decompressor is configured to generate a test pattern from the seed and the locations of scan inputs. The decompressor includes a first test pattern generator, a second test pattern generator, and a selector configured to select the test pattern generated by the first test pattern generator or the test pattern generated by the second test pattern generator using the locations of scan inputs.
Public/Granted literature
- US20090119563A1 METHOD AND APPARATUS FOR TESTING LOGIC CIRCUIT DESIGNS Public/Granted day:2009-05-07
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