Invention Grant
US07617064B2 Self-test circuit for high-definition multimedia interface integrated circuits
有权
用于高分辨率多媒体接口集成电路的自检电路
- Patent Title: Self-test circuit for high-definition multimedia interface integrated circuits
- Patent Title (中): 用于高分辨率多媒体接口集成电路的自检电路
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Application No.: US11403082Application Date: 2006-04-12
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Publication No.: US07617064B2Publication Date: 2009-11-10
- Inventor: Barry L. Stakely , Rodney D. Miller , Jingang Yi
- Applicant: Barry L. Stakely , Rodney D. Miller , Jingang Yi
- Applicant Address: US MA Norwood
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Norwood
- Agency: Kenyon & Kenyon LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition multimedia interface encoder, produces a plurality of channels of high frequency data from the data produced by the high-definition multimedia interface encoder. A multiplexer selects a channel for sampling, and a capacitive coupler capacitively couples the multiplexer to a sampling circuit. The sampling circuit produces sampled data corresponding to the high frequency data having a clock rate less than a clock rate of the high frequency data. A test circuit compares the sampled data with the data produced by the high-definition multimedia interface encoder.
Public/Granted literature
- US20060274563A1 Self-test circuit for high-definition multimedia interface integrated circuits Public/Granted day:2006-12-07
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