Invention Grant
- Patent Title: X-ray tube and X-ray analysis apparatus
- Patent Title (中): X射线管和X射线分析仪
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Application No.: US12175743Application Date: 2008-07-18
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Publication No.: US07627088B2Publication Date: 2009-12-01
- Inventor: Yoshiki Matoba , Yutaka Ikku
- Applicant: Yoshiki Matoba , Yutaka Ikku
- Applicant Address: JP Chiba
- Assignee: SII NanoTechnology Inc.
- Current Assignee: SII NanoTechnology Inc.
- Current Assignee Address: JP Chiba
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-196817 20070728
- Main IPC: H01J5/18
- IPC: H01J5/18 ; G01N23/223

Abstract:
A vacuumed enclosure has a window formed of an X-ray transmissive material. The vacuumed enclosure encloses an electron beam source for generating an electron beam and a target which, irradiated by the electron beam, generates a primary X-ray. The target is smaller in the outer dimension than the window and located on the center of the window such that it irradiates, through the window, the primary X-ray onto a sample located outside. The vacuumed enclosure further encloses an X-ray detector located such that it can detect a fluorescent X-ray and a scattered X-ray coming from the sample through the window. The X-ray detector generates a signal representative of energy information of the fluorescent X-ray and the scattered X-ray. The vacuumed enclosure further encloses a thermally and electrically conductive metal extending through the target across the widow.
Public/Granted literature
- US20090028297A1 X-RAY TUBE AND X-RAY ANALYSIS APPARATUS Public/Granted day:2009-01-29
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