Invention Grant
- Patent Title: Analysis apparatus and condenser
- Patent Title (中): 分析装置和冷凝器
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Application No.: US11274923Application Date: 2005-11-15
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Publication No.: US07632463B2Publication Date: 2009-12-15
- Inventor: Hidehito Takayama , Haruyo Saitou
- Applicant: Hidehito Takayama , Haruyo Saitou
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Kagaku Iatron, Inc.
- Current Assignee: Mitsubishi Kagaku Iatron, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Katten Muchin Rosenman LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
The object of the present invention is to provide an analysis apparatus that makes it possible to detect lights from a plurality of spots formed on an analysis chip without the lack of positioning accuracy while detecting the lights and the instability of holding the samples in spite of the downsized construction thereof.To achieve such an object as mentioned above, the analysis apparatus of the present invention for analyzing samples by means of detecting lights from a plurality of spots formed on an analysis chip so as to hold the samples comprising: a chip holder for holding the analysis chip; a light-sensitive detector for detecting lights from the spots; and a selectively light-transmitting unit for transmitting lights selectively from the desired spots to the light-sensitive detector, in a state where the analysis chip is held by the chip holder.
Public/Granted literature
- US20060182660A1 Analysis apparatus and condenser Public/Granted day:2006-08-17
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