发明授权
US07636870B2 Semiconductor integrated circuit device, and debugging system and method for the semiconductor integrated circuit device
有权
半导体集成电路器件，以及用于半导体集成电路器件的调试系统和方法
- 专利标题： Semiconductor integrated circuit device, and debugging system and method for the semiconductor integrated circuit device
- 专利标题（中）： 半导体集成电路器件，以及用于半导体集成电路器件的调试系统和方法
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申请号： US11586505申请日： 2006-10-26
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公开(公告)号： US07636870B2公开(公告)日： 2009-12-22
- 发明人: Shigeyuki Ueno
- 申请人： Shigeyuki Ueno
- 申请人地址： JP Kanagawa
- 专利权人： NEC Electronics Corporation
- 当前专利权人： NEC Electronics Corporation
- 当前专利权人地址： JP Kanagawa
- 代理机构： Young & Thompson
- 优先权： JP2005-315826 20051031
- 主分类号： G06F11/00
- IPC分类号： G06F11/00
摘要：
To provide a debugging system, debugging method, and a semiconductor integrated circuit device capable of collecting debug-target information with accuracy and improving debug efficiency. A semiconductor integrated circuit device according to an embodiment of the present invention includes: subsystems; a break detecting unit detecting that a program execution of a CPU core in one subsystem satisfies a predetermined break condition; and a break selecting unit stopping operations of one selected from the subsystems in accordance with the detection result of the break detecting unit.
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