Invention Grant
- Patent Title: Compound semiconductor device and the fabricating method of the same
- Patent Title (中): 复合半导体器件及其制造方法
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Application No.: US11181730Application Date: 2005-07-15
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Publication No.: US07638819B2Publication Date: 2009-12-29
- Inventor: Toshihide Kikkawa , Kenji Imanishi
- Applicant: Toshihide Kikkawa , Kenji Imanishi
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Kratz, Quintos & Hanson, LLP
- Priority: JP2004-332284 20041116
- Main IPC: H01L29/778
- IPC: H01L29/778

Abstract:
A GaN layer functions as an electron transit layer and is formed to exhibit, at least at a portion thereof, A/B ratio of 0.2 or less obtained by a photoluminescence measurement, where “A” is the light-emission intensity in the 500-600 nm band, and “B” is the light-emission intensity at the GaN band-edge.
Public/Granted literature
- US20060102926A1 Compound semiconductor device and the fabricating method of the same Public/Granted day:2006-05-18
Information query
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