Invention Grant
US07644310B2 Semiconductor IC incorporating a co-debugging function and test system
有权
具有并行调试功能和测试系统的半导体IC
- Patent Title: Semiconductor IC incorporating a co-debugging function and test system
- Patent Title (中): 具有并行调试功能和测试系统的半导体IC
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Application No.: US12193945Application Date: 2008-08-19
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Publication No.: US07644310B2Publication Date: 2010-01-05
- Inventor: Shin-Chan Kang , Sun-Kyu Kim
- Applicant: Shin-Chan Kang , Sun-Kyu Kim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR2004-08788 20040210
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.
Public/Granted literature
- US20080307260A1 SEMICONDUCTOR IC INCORPORATING A CO-DEBUGGING FUNCTION AND TEST SYSTEM Public/Granted day:2008-12-11
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