An improved ESD protection device, integrated circuit and method for programmably altering a sensitivity of the ESD protection device is provided herein. More specifically, an active shunt ESD protection device is provided with an improved trigger circuit design. The improved trigger circuit design enables the sensitivity of the ESD protection device to be altered by providing a variety of programmable elements for adjusting an RC time constant of a slew rate detector contained therein. The programmable elements allow the RC time constant to be altered at the wafer or package level, and avoid the significant time and cost typically associated with conventional trial-and-error adjustment procedures.