公开(公告)号：US07507944B1

公开(公告)日：2009-03-24

申请号：US11477067

申请日：2006-06-27

Applicant: Daniel Arnzen ,  Thurman John Rodgers

Inventor： Daniel Arnzen ,  Thurman John Rodgers

IPC: H01L27/00 ,  H01L31/00

CPC classification number: H01L31/0203 ,  H01L27/14603 ,  H01L27/1464 ,  H01L27/14685 ,  H01L31/02325

Abstract: A non-planar frame base for an image sensor.

Abstract translation: 用于图像传感器的非平面框架基座。

公开(公告)号：US20070285854A1

公开(公告)日：2007-12-13

申请号：US11422926

申请日：2006-06-08

Applicant: Thurman John Rodgers ,  Babak Taheri ,  Dan Zupcau

Inventor： Thurman John Rodgers ,  Babak Taheri ,  Dan Zupcau

IPC: H02H9/00

CPC classification number: H02H3/006 ,  H02H9/046

Abstract: An improved ESD protection device, integrated circuit and method for programmably altering a sensitivity of the ESD protection device is provided herein. More specifically, an active shunt ESD protection device is provided with an improved trigger circuit design. The improved trigger circuit design enables the sensitivity of the ESD protection device to be altered by providing a variety of programmable elements for adjusting an RC time constant of a slew rate detector contained therein. The programmable elements allow the RC time constant to be altered at the wafer or package level, and avoid the significant time and cost typically associated with conventional trial-and-error adjustment procedures.

Abstract translation: 本文提供了一种用于可编程地改变ESD保护装置的灵敏度的改进的ESD保护装置，集成电路和方法。 更具体地，主动分流ESD保护装置具有改进的触发电路设计。 改进的触发电路设计可以通过提供用于调节其中包含的压摆率检测器的RC时间常数的各种可编程元件来改变ESD保护装置的灵敏度。 可编程元件允许在晶片或封装级别改变RC时间常数，并避免通常与传统的试错法调整程序相关的显着时间和成本。

公开(公告)号：US07660086B2

公开(公告)日：2010-02-09

申请号：US11422926

申请日：2006-06-08

Applicant: Thurman John Rodgers ,  Babak Taheri ,  Dan Zupcau

Inventor： Thurman John Rodgers ,  Babak Taheri ,  Dan Zupcau

IPC: H02H3/22

CPC classification number: H02H3/006 ,  H02H9/046

Abstract: An improved ESD protection device, integrated circuit and method for programmably altering a sensitivity of the ESD protection device is provided herein. More specifically, an active shunt ESD protection device is provided with an improved trigger circuit design. The improved trigger circuit design enables the sensitivity of the ESD protection device to be altered by providing a variety of programmable elements for adjusting an RC time constant of a slew rate detector contained therein. The programmable elements allow the RC time constant to be altered at the wafer or package level, and avoid the significant time and cost typically associated with conventional trial-and-error adjustment procedures.

Abstract translation: 本文提供了一种用于可编程地改变ESD保护装置的灵敏度的改进的ESD保护装置，集成电路和方法。 更具体地，主动分流ESD保护装置具有改进的触发电路设计。 改进的触发电路设计可以通过提供用于调节其中包含的压摆率检测器的RC时间常数的各种可编程元件来改变ESD保护装置的灵敏度。 可编程元件允许在晶片或封装级别改变RC时间常数，并避免通常与传统的试错法调整程序相关的显着时间和成本。