Invention Grant
- Patent Title: Visual inspection method and visual inspection apparatus
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Application No.: US12424105Application Date: 2009-04-15
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Publication No.: US07664306B2Publication Date: 2010-02-16
- Inventor: Yoshihiro Sasaki , Masahiko Nagao
- Applicant: Yoshihiro Sasaki , Masahiko Nagao
- Applicant Address: JP Kanagawa
- Assignee: NEC Electronics Corporation
- Current Assignee: NEC Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2001-037497 20010214
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H04N7/18

Abstract:
In a visual inspection method and apparatus, a picture processing unit converts an original picture, obtained by taking a photograph of a BGA illuminated by a ring illuminator from above, by using a camera, and labels a binary picture obtained by this binary conversion. Then, it forms a circumscribing rectangle circumscribing an outer circumference of a labeling picture obtained by the labeling, and inverts a labeling picture within the formed rectangle, and removes a portion of a region formed by the outer circumference and the circumscribing rectangle in a picture obtained by the inversion, and then generates an inspection picture by adding a picture obtained by the removal to the labeling picture, and accordingly judges a pass or rejection of the inspection target sample based on the generated inspection picture. Thus, the inspection can be carried out at a high accuracy irrespectively of a low cost.
Public/Granted literature
- US20090202141A1 VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS Public/Granted day:2009-08-13
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