Invention Grant
US07668006B2 Multi-port phase change random access memory cell and multi-port phase change random access memory device including the same
有权
多端口相变随机存取存储单元和多端口相变随机存取存储器件包括相同
- Patent Title: Multi-port phase change random access memory cell and multi-port phase change random access memory device including the same
- Patent Title (中): 多端口相变随机存取存储单元和多端口相变随机存取存储器件包括相同
-
Application No.: US11902704Application Date: 2007-09-25
-
Publication No.: US07668006B2Publication Date: 2010-02-23
- Inventor: Kwang-jin Lee , Du-eung Kim , Chang-soo Lee , Qi Wang
- Applicant: Kwang-jin Lee , Du-eung Kim , Chang-soo Lee , Qi Wang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2006-0097601 20061004
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A multi-port phase change random access memory (PRAM) cell, includes a PRAM element including a phase change material, a writing controller configured to operate in correspondence with a writing word line, the writing controller connecting a writing bit line to the PRAM element, and a reading controller configured to operate in correspondence with a reading word line, the reading controller connecting the PRAM element to a reading bit line.
Public/Granted literature
Information query