发明授权
- 专利标题: Cleaning method, apparatus and cleaning system
- 专利标题(中): 清洁方法,设备和清洁系统
-
申请号: US11544931申请日: 2006-10-10
-
公开(公告)号: US07671347B2公开(公告)日: 2010-03-02
- 发明人: Dirk Heinrich Ehm , Johannes Hubertus Josephina Moors , Bastiaan Theodoor Wolschrijn , Marcus Gerhardus Hendrikus Meijerink , Thomas Stein
- 申请人: Dirk Heinrich Ehm , Johannes Hubertus Josephina Moors , Bastiaan Theodoor Wolschrijn , Marcus Gerhardus Hendrikus Meijerink , Thomas Stein
- 申请人地址: NL Veldhoven DE Oberkochen
- 专利权人: ASML Netherlands B.V.,Carl Zeiss SMT AG
- 当前专利权人: ASML Netherlands B.V.,Carl Zeiss SMT AG
- 当前专利权人地址: NL Veldhoven DE Oberkochen
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 主分类号: G21K5/00
- IPC分类号: G21K5/00
摘要:
A method to clean optical elements of an apparatus, the apparatus being configured to project a beam of radiation onto a target portion of a substrate, the apparatus comprising a plurality of optical elements arranged in sequence in the path of the radiation beam, wherein the cleaning method comprises: cleaning one or more second optical elements of the sequence, which receive one or more relatively low second radiation doses during operation of the apparatus, utilizing cumulatively shorter cleaning periods than one or more first optical elements of the sequence that receive one or more first radiation doses during operation of the apparatus, a second radiation dose being lower than each relatively high first radiation dose.
公开/授权文献
- US20080083878A1 Cleaning method, apparatus and cleaning system 公开/授权日:2008-04-10
信息查询