Invention Grant
- Patent Title: Measuring system and method
- Patent Title (中): 测量系统和方法
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Application No.: US12211264Application Date: 2008-09-16
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Publication No.: US07671619B2Publication Date: 2010-03-02
- Inventor: Wei-Cheng Lin , Cheng-Ho Yu
- Applicant: Wei-Cheng Lin , Cheng-Ho Yu
- Applicant Address: TW Miaooli Country
- Assignee: TPO Displays Corp.
- Current Assignee: TPO Displays Corp.
- Current Assignee Address: TW Miaooli Country
- Agency: Thomas, Kayden, Horstemeyer & Risley LLP
- Priority: TW96134705A 20070917
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
A measuring system comprises a pulse generator, an under test device, a variable resistor and a detecting control system. The pulse generator provides pulse signals with different voltage peaks to the under test device and the variable resistor. The variable resistor adjusts its resistance value according to a control signal. The detecting control system detects the voltage ringing ranges of the first terminal of the under test device at different resistance values. The detecting control system generates the control signal to adjust the resistance value of the variable resistor according to the voltage ringing ranges.
Public/Granted literature
- US20090074154A1 Measuring System and Method Public/Granted day:2009-03-19
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