发明授权
US07672804B2 Analog signal test using a-priori information 有权
使用先验信息的模拟信号测试

Analog signal test using a-priori information
摘要:
A method and a corresponding system for testing an analog signal under test includes using knowledge of at least one parameter of the signal under test. The method includes generating a reference signal using the knowledge of at least one parameter of the signal under test, combining the generated reference signal with the signal under test, resulting in a combination signal, and evaluating the combination signal for testing the signal under test.
公开/授权文献
信息查询
0/0