Invention Grant
US07678214B2 In-process vision detection of flaws and FOD by back field illumination
有权
通过后场照明进行瑕疵和FOD的过程中视觉检测
- Patent Title: In-process vision detection of flaws and FOD by back field illumination
- Patent Title (中): 通过后场照明进行瑕疵和FOD的过程中视觉检测
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Application No.: US12179681Application Date: 2008-07-25
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Publication No.: US07678214B2Publication Date: 2010-03-16
- Inventor: Roger W. Engelbart , Reed Hannebaum , Tim Pollock
- Applicant: Roger W. Engelbart , Reed Hannebaum , Tim Pollock
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Ostrager Chong Flaherty & Broitman P.C.
- Main IPC: B32B41/00
- IPC: B32B41/00
Abstract:
A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
Public/Granted literature
- US20080277042A1 IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION Public/Granted day:2008-11-13
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