发明授权
- 专利标题: Method for manufacturing a semiconductor component and a semiconductor component, in particular a diaphragm sensor
- 专利标题(中): 用于制造半导体部件和半导体部件的方法,特别是膜片传感器
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申请号: US12001289申请日: 2007-12-10
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公开(公告)号: US07679154B2公开(公告)日: 2010-03-16
- 发明人: Hubert Benzel , Heribert Weber , Hans Artmann , Thorsten Pannek , Frank Schäfer
- 申请人: Hubert Benzel , Heribert Weber , Hans Artmann , Thorsten Pannek , Frank Schäfer
- 申请人地址: DE Stuttgart
- 专利权人: Robert Bosch GmbH
- 当前专利权人: Robert Bosch GmbH
- 当前专利权人地址: DE Stuttgart
- 代理机构: Kenyon & Kenyon LLP
- 优先权: DE10138759 20010807
- 主分类号: H01L29/84
- IPC分类号: H01L29/84
摘要:
In a method for manufacturing a semiconductor component having a semiconductor substrate, a flat, porous diaphragm layer and a cavity underneath the porous diaphragm layer are produced to form unsupported structures for a component. In a first approach, the semiconductor substrate may receive a doping in the diaphragm region that is different from that of the cavity. This permits different pore sizes and/or porosities to be produced, which is used in producing the cavity for improved etching gas transport. Also, mesopores may be produced in the diaphragm region and nanopores may be produced as an auxiliary structure in what is to become the cavity region.
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