发明授权
- 专利标题: Phase change memory apparatus having an improved cycling endurance and programming method therefor
- 专利标题(中): 具有改进的循环耐久性和编程方法的相变存储装置
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申请号: US12318365申请日: 2008-12-29
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公开(公告)号: US07679954B2公开(公告)日: 2010-03-16
- 发明人: Suyoun Lee , Byung-ki Cheong , Jeung-hyun Jeong , Taek Sung Lee , Won Mok Kim
- 申请人: Suyoun Lee , Byung-ki Cheong , Jeung-hyun Jeong , Taek Sung Lee , Won Mok Kim
- 申请人地址: KR Seoul
- 专利权人: Korea Institute of Science and Technology
- 当前专利权人: Korea Institute of Science and Technology
- 当前专利权人地址: KR Seoul
- 代理机构: Bacon & Thomas, PLLC
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A phase change memory apparatus includes a phase change memory array in which a plurality of phase change memory devices are arranged, and a pulse generator that supplies a writing current pulse, an erasure current pulse, and a reverse repair current pulse to the phase change memory devices in the phase change memory array. The reverse repair current pulse has opposite direction to the writing current pulse and the erasure current pulse of the phase change memory devices, and is of such a size that resultant Joule heat and electromigration move the elements of the reverse repair current pulse. The reverse repair current pulse has a width equal to or more than a smaller one of duration of a normal writing operation and duration of a normal erasure operation.
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