发明授权
US07683330B2 Method for determining positron emission measurement information in the context of positron emission tomography
有权
在正电子发射断层扫描的背景下确定正电子发射测量信息的方法
- 专利标题: Method for determining positron emission measurement information in the context of positron emission tomography
- 专利标题(中): 在正电子发射断层扫描的背景下确定正电子发射测量信息的方法
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申请号: US11438209申请日: 2006-05-23
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公开(公告)号: US07683330B2公开(公告)日: 2010-03-23
- 发明人: Robert Krieg , Rainer Kuth , Ralf Ladebeck , Ralph Oppelt , Sebastian Schmidt , Markus Vester
- 申请人: Robert Krieg , Rainer Kuth , Ralf Ladebeck , Ralph Oppelt , Sebastian Schmidt , Markus Vester
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DE Munich
- 代理机构: Harness, Dickey & Pierce, PLC
- 优先权: DE102005023907 20050524
- 主分类号: G01T1/166
- IPC分类号: G01T1/166
摘要:
A method is disclosed for determining positron emission measurement information in the context of positron emission tomography. The method includes carrying out a positron emission measurement, in a body area of a subject to be examined, to record positron emission measurement information with point resolution and determining a time frame of the measurement by, at the same time, generating images of the body area to be examined with a relatively higher time resolution and with point-resolved image data, using a second imaging method. Further, a local shift of points of individual images of the second imaging method is determined, caused by movement processes of the subject to be examined, and as a function thereof, of the positron emission measurement information for at least a part of the measurement period and of the body area to be examined. Finally, the positron emission measurement information is adjusted as a function of the determined shift.