发明授权
- 专利标题： Method of testing memory card operation
- 专利标题（中）： 测试存储卡操作的方法
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申请号： US11693644申请日： 2007-03-29
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公开(公告)号： US07685478B2公开(公告)日： 2010-03-23
- 发明人: Alan Chiou , Bahman Qawami , Farshid Sabet-sharghi
- 申请人： Alan Chiou , Bahman Qawami , Farshid Sabet-sharghi
- 申请人地址： US CA Milpitas
- 专利权人： SanDisk Corporation
- 当前专利权人： SanDisk Corporation
- 当前专利权人地址： US CA Milpitas
- 代理机构： Vierra Magen Marcus & DeNiro LLP
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
A system and method are disclosed for testing operation of a memory card within an electronic host device. The system includes a flat flexible cable, or strip, for electrically coupling between the memory card slot in a host device and a test assembly. The test assembly may have a card slot for accepting an external memory card, and a debug header for receiving a cable connected to a debug apparatus such as a logic analyzer and/or an oscilloscope.
公开/授权文献
- US20080244143A1 METHOD OF TESTING MEMORY CARD OPERATION 公开/授权日：2008-10-02
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